Field Emission Gun Scanning Electron Microscope (FEGSEM)

Scanning electron microscopy (SEM) is a microscopy technique in which a beam of electrons are directed at a specimen of interest. The electron beam interacts with the specimen generating a number of secondary emissions. An SEM provides the ability for high resolution surface imaging with a long depth of field images to be acquired. All our FEGSEM’s have auxiliary Energy Dispersive Spectroscopy (EDS) detectors and Electron backscatter diffraction (EBSD) cameras.

A FEGSEM is an indispensable analytical tool for research and solving industrial problems where optical microscopes will not provide the required resolution. The AMC has recently invested in two new FEGSEM’s to increase the capacity within the centre, this is in addition to the combined FIB/FEGSEM (Dualbeam) system which is also located within the centre.

Samples can be viewed coated or uncoated. Maximum sample size 150mm by 150mm.