Electron Backscatter Diffraction (EBSD)

EBSD is a scanning electron microscopy (SEM) technique applicable to crystalline materials which provides crystallographic information. An advantage of EBSD is that the microstructure can be characterised in detail and also quantified. Below is a list of examples where EBSD can be used to quantify the features within a microstructure:

  • Texture analysis
  • Phase identification
  • Grain size analysis
  • Grain boundary analysis to identify the rotation angles of specific boundaries

For EBSD samples should be flat and parallel on both sides, with one face well-polished.

For further information on access to any of the instruments please contact:

Professor Sarah Gabbott - Director of the Advanced Microscopy Centre 
Department of Engineering University of Leicester 
Leicester, LE1 7RH 
Email: sg21@le.ac.uk 
Tel: +44(0)116 252 3636

For industry enquiries please contact:

Mr Vinay Patel - Advanced Microscopy Centre Manager 
Department of Engineering 
Email: vp118@le.ac.uk 
Tel: +44(0)116 229 7330