Electron Backscatter Diffraction (EBSD)

EBSD is a scanning electron microscopy (SEM) technique applicable to crystalline materials which provides crystallographic information. An advantage of EBSD is that the microstructure can be characterised in detail and also quantified. Below is a list of examples where EBSD can be used to quantify the features within a microstructure:

• Texture analysis
• Phase identification
• Grain size analysis
• Grain boundary analysis to identify the rotation angles of specific boundaries

For EBSD samples should be flat and parallel on both sides, with one face well-polished.